3 AFM Cantilevers on One Side of the AFM Probe

HQ:NSC35/Hard/Al BS

AFM Probe with 3 Different Long Scanning, DLC Hardened Tapping Mode Cantilevers

Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated

Cantilevers: 3

F 205 kHz

C 8.9 N/m

L 110 µm

F 300 kHz

C 16 N/m

L 90 µm

F 150 kHz

C 5.4 N/m

L 130 µm

qp-BioAC-CI

uniqprobe™ BioAC with Rounded Tips for Cell Imaging

Coating: Reflex (Au)
Tip Shape: Circular symmetric

Cantilevers: 3

F 90 kHz

C 0.3 N/m

L 40 µm

F 50 kHz

C 0.1 N/m

L 60 µm

F 30 kHz

C 0.06 N/m

L 80 µm

qp-fast

uniqprobe™ for Soft/Standard/Fast Tapping/Dynamic AFM imaging

Coating: Reflex (Au)
Tip Shape: Circular symmetric

Cantilevers: 3

F 800 kHz

C 80 N/m

L 40 µm

F 420 kHz

C 30 N/m

L 60 µm

F 250 kHz

C 15 N/m

L 80 µm

HQ:NSC35/Cr-Au BS

AFM Probe with 3 Different Gold Coated Tapping Mode Cantilevers

Coating: Reflex (Au)
Tip Shape: Rotated

Cantilevers: 3

F 205 kHz

C 8.9 N/m

L 110 µm

F 300 kHz

C 16 N/m

L 90 µm

F 150 kHz

C 5.4 N/m

L 130 µm

HQ:NSC36/Cr-Au BS

AFM Probe with 3 Different Gold Coated Force Modulation Mode Cantilevers

Coating: Reflex (Au)
Tip Shape: Rotated

Cantilevers: 3

F 90 kHz

C 1 N/m

L 110 µm

F 130 kHz

C 2 N/m

L 90 µm

F 65 kHz

C 0.6 N/m

L 130 µm

qp-BioAC

uniqprobe™ - uniform quality SPM probe for non-contact/tapping mode/contact mode with 3 different cantilevers

Coating: Reflex (Au)
Tip Shape: Circular symmetric

Cantilevers: 3

F 90 kHz

C 0.3 N/m

L 40 µm

F 50 kHz

C 0.1 N/m

L 60 µm

F 30 kHz

C 0.06 N/m

L 80 µm

Special Developments

Not available in the standard scope of products

Coating: various
Tip Shape: various

HQ:NSC36/Co-Cr/Al BS

Hard Magnetic, Medium Momentum AFM Probe with 3 Different Cantilevers

Coating: Magnetic
Tip Shape: Rotated

Cantilevers: 3

F 60 kHz

C 1 N/m

L 110 µm

F 130 kHz

C 2 N/m

L 90 µm

F 65 kHz

C 0.6 N/m

L 130 µm

New

3XC-NA

AFM Probe with 3 Different Cantilevers for Various Applications and  Tips at the Very End of the Cantilevers

Coating: Reflex Aluminum
Tip Shape: OPUS

Cantilevers: 3

F 17 kHz

C 0.3 N/m

L 500 µm

F 150 kHz

C 9 N/m

L 175 µm

F 75 kHz

C 2.5 N/m

L 240 µm

HQ:NSC35/Al BS

AFM Probe with 3 Different Tapping Mode Cantilevers

Coating: Reflex Aluminum
Tip Shape: Rotated

Cantilevers: 3

F 205 kHz

C 8.9 N/m

L 110 µm

F 300 kHz

C 16 N/m

L 90 µm

F 150 kHz

C 5.4 N/m

L 130 µm

Mix and Match Box

Mixed box: up to 400 MikroMasch AFM probes

Coating: various
Tip Shape: various

HQ:NSC36/Al BS

AFM Probe with 3 Different Force Modulation Mode Cantilevers

Coating: Reflex Aluminum
Tip Shape: Rotated

Cantilevers: 3

F 90 kHz

C 1 N/m

L 110 µm

F 130 kHz

C 2 N/m

L 90 µm

F 65 kHz

C 0.6 N/m

L 130 µm

HQ:NSC35/No Al

AFM Probe with 3 Different Tapping Mode Cantilevers

Coating: none
Tip Shape: Rotated

Cantilevers: 3

F 205 kHz

C 8.9 N/m

L 110 µm

F 300 kHz

C 16 N/m

L 90 µm

F 150 kHz

C 5.4 N/m

L 130 µm

HQ:NSC36/No Al

AFM Probe with 3 Different Force Modulation Mode Cantilevers

Coating: none
Tip Shape: Rotated

Cantilevers: 3

F 90 kHz

C 1 N/m

L 110 µm

F 130 kHz

C 2 N/m

L 90 µm

F 65 kHz

C 0.6 N/m

L 130 µm

New

3XC-NN

AFM Probe with 3 Different Cantilevers for Various Applications and  Tips at the Very End of the Cantilevers

Coating: none
Tip Shape: OPUS

Cantilevers: 3

F 17 kHz

C 0.3 N/m

L 500 µm

F 150 kHz

C 9 N/m

L 175 µm

F 75 kHz

C 2.5 N/m

L 240 µm

HQ:NSC36/Hard/Al BS

AFM Probe with 3 Different Long Scanning, DLC Hardened Force Modulation Mode Cantilevers

Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated

Cantilevers: 3

F 90 kHz

C 1 N/m

L 110 µm

F 130 kHz

C 2 N/m

L 90 µm

F 65 kHz

C 0.6 N/m

L 130 µm

HQ:CSC37/Al BS

AFM Probe with 3 Different Contact Mode Cantilevers

Coating: Reflex Aluminum
Tip Shape: Rotated

Cantilevers: 3

F 40 kHz

C 0.8 N/m

L 250 µm

F 20 kHz

C 0.3 N/m

L 350 µm

F 30 kHz

C 0.4 N/m

L 300 µm

HQ:CSC38/Al BS

AFM Probe with 3 Different Contact Mode Cantilevers

Coating: Reflex Aluminum
Tip Shape: Rotated

Cantilevers: 3

F 20 kHz

C 0.09 N/m

L 250 µm

F 10 kHz

C 0.03 N/m

L 350 µm

F 14 kHz

C 0.05 N/m

L 300 µm

HQ:CSC37/No Al

AFM Probe with 3 Different Contact Mode Cantilevers

Coating: none
Tip Shape: Rotated

Cantilevers: 3

F 40 kHz

C 0.8 N/m

L 250 µm

F 20 kHz

C 0.3 N/m

L 350 µm

F 30 kHz

C 0.4 N/m

L 300 µm

HQ:CSC38/No Al

AFM Probe with 3 Different Contact Mode Cantilevers

Coating: none
Tip Shape: Rotated

Cantilevers: 3

F 20 kHz

C 0.09 N/m

L 250 µm

F 10 kHz

C 0.03 N/m

L 350 µm

F 14 kHz

C 0.05 N/m

L 300 µm