3 AFM Cantilevers on One Side of the AFM Probe

AFM probes with three AFM cantilevers on one side of the holder chip
40 results matching your criteria
HQ:NSC35/Al BS

HQ:NSC35/Al BS

AFM Probe with 3 Different Tapping Mode Cantilevers
Coating: Reflex Aluminum
Tip Shape: Rotated
AFM Cantilevers: 3
F 205 kHz
C 8.9 N/m
L 110 µm
F 300 kHz
C 16 N/m
L 90 µm
F 150 kHz
C 5.4 N/m
L 130 µm
HQ:NSC35/Hard/Al BS

HQ:NSC35/Hard/Al BS

AFM Probe with 3 Different Long Scanning, DLC Hardened Tapping Mode Cantilevers
Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated
AFM Cantilevers: 3
F 205 kHz
C 8.9 N/m
L 110 µm
F 300 kHz
C 16 N/m
L 90 µm
F 150 kHz
C 5.4 N/m
L 130 µm
HQ:NSC35/Pt

HQ:NSC35/Pt

AFM Probe with 3 Different Electrical, Tapping Mode Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 3
F 205 kHz
C 8.9 N/m
L 110 µm
F 300 kHz
C 16 N/m
L 90 µm
F 150 kHz
C 5.4 N/m
L 130 µm
best of the best
qp-BioAC

qp-BioAC

uniqprobe™ - uniform quality SPM probe for non-contact/tapping mode/contact mode with 3 different cantilevers

Coating: Reflex Gold
Tip Shape: Circular symmetric
AFM Cantilevers: 3
F 90 kHz
C 0.3 N/m
L 40 µm
F 50 kHz
C 0.1 N/m
L 60 µm
F 30 kHz
C 0.06 N/m
L 80 µm
best of the best
qp-fast

qp-fast

uniqprobe™ for Soft/Standard/Fast Tapping/Dynamic AFM imaging
Coating: Reflex Gold
Tip Shape: Circular symmetric
AFM Cantilevers: 3
F 800 kHz
C 80 N/m
L 40 µm
F 420 kHz
C 30 N/m
L 60 µm
F 250 kHz
C 15 N/m
L 80 µm
HQ:NSC35/Cr-Au BS

HQ:NSC35/Cr-Au BS

AFM Probe with 3 Different Gold Coated Tapping Mode Cantilevers
Coating: Reflex Gold
Tip Shape: Rotated
AFM Cantilevers: 3
F 205 kHz
C 8.9 N/m
L 110 µm
F 300 kHz
C 16 N/m
L 90 µm
F 150 kHz
C 5.4 N/m
L 130 µm
HQ:NSC36/Cr-Au BS

HQ:NSC36/Cr-Au BS

AFM Probe with 3 Different Gold Coated Force Modulation Mode Cantilevers
Coating: Reflex Gold
Tip Shape: Rotated
AFM Cantilevers: 3
F 90 kHz
C 1 N/m
L 110 µm
F 130 kHz
C 2 N/m
L 90 µm
F 65 kHz
C 0.6 N/m
L 130 µm
New
qp-BioAC-CI

qp-BioAC-CI

uniqprobe™ BioAC with Rounded Tips for Cell Imaging
Coating: Reflex Gold
Tip Shape: Circular symmetric
AFM Cantilevers: 3
F 90 kHz
C 0.3 N/m
L 40 µm
F 50 kHz
C 0.1 N/m
L 60 µm
F 30 kHz
C 0.06 N/m
L 80 µm
HQ:NSC36/Co-Cr/Al BS

HQ:NSC36/Co-Cr/Al BS

Hard Magnetic, Medium Momentum AFM Probe with 3 Different Cantilevers
Coating: Magnetic
Tip Shape: Rotated
AFM Cantilevers: 3
F 60 kHz
C 1 N/m
L 110 µm
F 130 kHz
C 2 N/m
L 90 µm
F 65 kHz
C 0.6 N/m
L 130 µm
Mix and Match Box

Mix and Match Box

Mixed box: up to 400 MikroMasch AFM probes
Coating: various
Tip Shape: various
top value
3XC-NA

3XC-NA

AFM Probe with 3 Different AFM Cantilevers for Various Applications and AFM  Tips at the Very End of the AFM Cantilevers

Coating: Reflex Aluminum
Tip Shape: OPUS
AFM Cantilevers: 3
F 17 kHz
C 0.3 N/m
L 500 µm
F 150 kHz
C 9 N/m
L 175 µm
F 75 kHz
C 2.5 N/m
L 240 µm
HQ:NSC36/Al BS

HQ:NSC36/Al BS

AFM Probe with 3 Different Force Modulation Mode Cantilevers
Coating: Reflex Aluminum
Tip Shape: Rotated
AFM Cantilevers: 3
F 90 kHz
C 1 N/m
L 110 µm
F 130 kHz
C 2 N/m
L 90 µm
F 65 kHz
C 0.6 N/m
L 130 µm
HQ:NSC35/No Al

HQ:NSC35/No Al

AFM Probe with 3 Different Tapping Mode Cantilevers
Coating: none
Tip Shape: Rotated
AFM Cantilevers: 3
F 205 kHz
C 8.9 N/m
L 110 µm
F 300 kHz
C 16 N/m
L 90 µm
F 150 kHz
C 5.4 N/m
L 130 µm
HQ:NSC36/No Al

HQ:NSC36/No Al

AFM Probe with 3 Different Force Modulation Mode Cantilevers
Coating: none
Tip Shape: Rotated
AFM Cantilevers: 3
F 90 kHz
C 1 N/m
L 110 µm
F 130 kHz
C 2 N/m
L 90 µm
F 65 kHz
C 0.6 N/m
L 130 µm
3XC-NN

3XC-NN

AFM Probe with 3 Different AFM Cantilevers for Various Applications and AFM  Tips at the Very End of the AFM Cantilevers
Coating: none
Tip Shape: OPUS
AFM Cantilevers: 3
F 17 kHz
C 0.3 N/m
L 500 µm
F 150 kHz
C 9 N/m
L 175 µm
F 75 kHz
C 2.5 N/m
L 240 µm
HQ:NSC36/Hard/Al BS

HQ:NSC36/Hard/Al BS

AFM Probe with 3 Different Long Scanning, DLC Hardened Force Modulation Mode Cantilevers
Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated
AFM Cantilevers: 3
F 90 kHz
C 1 N/m
L 110 µm
F 130 kHz
C 2 N/m
L 90 µm
F 65 kHz
C 0.6 N/m
L 130 µm
HQ:CSC37/Al BS

HQ:CSC37/Al BS

AFM Probe with 3 Different Contact Mode Cantilevers
Coating: Reflex Aluminum
Tip Shape: Rotated
AFM Cantilevers: 3
F 40 kHz
C 0.8 N/m
L 250 µm
F 20 kHz
C 0.3 N/m
L 350 µm
F 30 kHz
C 0.4 N/m
L 300 µm
HQ:CSC38/Al BS

HQ:CSC38/Al BS

AFM Probe with 3 Different Contact Mode Cantilevers
Coating: Reflex Aluminum
Tip Shape: Rotated
AFM Cantilevers: 3
F 20 kHz
C 0.09 N/m
L 250 µm
F 10 kHz
C 0.03 N/m
L 350 µm
F 14 kHz
C 0.05 N/m
L 300 µm
HQ:CSC37/No Al

HQ:CSC37/No Al

AFM Probe with 3 Different Contact Mode Cantilevers
Coating: none
Tip Shape: Rotated
AFM Cantilevers: 3
F 40 kHz
C 0.8 N/m
L 250 µm
F 20 kHz
C 0.3 N/m
L 350 µm
F 30 kHz
C 0.4 N/m
L 300 µm
HQ:CSC38/No Al

HQ:CSC38/No Al

AFM Probe with 3 Different Contact Mode Cantilevers
Coating: none
Tip Shape: Rotated
AFM Cantilevers: 3
F 20 kHz
C 0.09 N/m
L 250 µm
F 10 kHz
C 0.03 N/m
L 350 µm
F 14 kHz
C 0.05 N/m
L 300 µm
2