AFM cantilevers of the 17 series with low force constant offer high sensitivity in contact mode AFM. These AFM cantilevers are also used for Lateral Force Microscopy.
A wear-resistant coating with thickness 20 nm is applied to the tip side of the AFM cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.
This AFM probe features alignment grooves on the back side of the holder chip.