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HQ:CSC17/Hard/Al BS-15 Box of 15 AFM Probes
595.00 USD
HQ:CSC17/Hard/Al BS-50 Box of 50 AFM Probes
1650.00 USD
Your volume discount is 333.33 USD or 16.80%
Product availability: On stock
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HQ:CSC17/Hard/Al BS

Long Scanning, DLC Hardened Contact Mode AFM Probe

Manufacturer: MikroMasch

Coating: Hard Diamond-Like-Carbon
AFM tip shape: Rotated
AFM Cantilever
F 13 kHz
C 0.18 N/m
L 450 µm
*nominal values
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AFM cantilevers of the 17 series with low force constant offer high sensitivity in contact mode AFM. These AFM cantilevers are also used for Lateral Force Microscopy.

A wear-resistant coating with thickness 20 nm is applied to the tip side of the AFM cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.

This AFM probe features alignment grooves on the back side of the holder chip.

Wear-resistant coating with thickness 20 nm on the tipside of the cantilever. Al coating with thickness 30nm on the backside of the cantilever.
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 0.18 N/m (0.06 - 0.4 N/m)*
  • 13 kHz (10 - 17 kHz)*
  • 450 µm (445 - 455 µm)*
  • 50 µm (47 - 53 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
  • * typical range