Cantilevers of the 17 series with the low spring constant are used in contact mode AFM mostly. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of the soft samples.
This product features alignment grooves on the back side of the holder chip.
(0.06 - 0.4 N/m)*
(10 - 17 kHz)*
(445 - 455 µm)*
(47 - 53 µm)*
( 1.5 - 2.5 µm)*
* typical range
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