AFM Probes » HQ:CSC37/Cr-Au

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Order Code / Price*
Quantity
HQ:CSC37/Cr-Au-15 Box of 15 AFM Probes
360.00 USD
Volume Discount Available [?]
HQ:CSC37/Cr-Au-50 Box of 50 AFM Probes
900.00 USD
Your volume discount is 300.00 USD or 25.00%
HQ:CSC37/Cr-Au-100 Box of 100 AFM Probes
1 620.00 USD
Your volume discount is 780.00 USD or 32.50%
Product availability: On stock
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HQ:CSC37/Cr-Au

AFM Probe with 3 Different Gold Coated Contact Mode Cantilevers

Coating: (Au) Overall
Tip shape: Rotated
This probe features 3 cantilevers
F 40 kHz
C 0.8 N/m
L 250 µm
F 20 kHz
C 0.3 N/m
L 350 µm
F 30 kHz
C 0.4 N/m
L 300 µm
*nominal values

Applications

Probes of the 37 series have three different contact mode cantilevers on one side of the holder chip. They can be used in various applications.

Probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and backside of the cantilever. Resulting tip radius is below 35 nm. The coating may cause cantilever bending within 3°.

This product features alignment grooves on the back side of the holder chip.

Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both tipside and backside of the cantilever.

AFM Tip:


  • 3 AFM Cantilevers:

    Cantilever A
  • Beam
  • 0.8 N/m (0.3 - 2 N/m)*
  • 40 kHz (30 - 55 kHz)*
  • 250 µm
  • 35 µm
  • 2 µm
  • Cantilever B
  • Beam
  • 0.3 N/m (0.1 - 0.6 N/m)*
  • 20 kHz (15 - 30 kHz)*
  • 350 µm
  • 35 µm
  • 2.0 µm
  • Cantilever C
  • Beam
  • 0.4 N/m (0.1 - 1 N/m)*
  • 30 kHz (20 - 40 kHz)*
  • 300 µm
  • 35 µm
  • 2.0 µm
  • * typical range
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