AFM Probes » HQ:CSC37/Pt

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HQ:CSC37/Pt-15 Box of 15 AFM Probes
360.00 USD
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HQ:CSC37/Pt-50 Box of 50 AFM Probes
900.00 USD
Your volume discount is 300.00 USD or 25.00%
HQ:CSC37/Pt-100 Box of 100 AFM Probes
1 620.00 USD
Your volume discount is 780.00 USD or 32.50%
Product availability: On stock
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HQ:CSC37/Pt

AFM Probe with 3 Different Electrical, Contact Mode AFM Cantilevers

Manufacturer: MikroMasch

Coating: Electrically Conductive
AFM tip shape: Rotated
This probe features 3 cantilevers
F 40 kHz
C 0.8 N/m
L 250 µm
F 20 kHz
C 0.3 N/m
L 350 µm
F 30 kHz
C 0.4 N/m
L 300 µm
*nominal values

Applications

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AFM probes of the 37 series have three different contact mode AFM cantilevers on one side of the holder chip. They can be used for various electrical measurements.

AFM probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is about 30 nm.

The 30 nm conductive Pt coating is continuous from the tip end to the bulk of the silicon chip. The coating covers both the tip and the back side of the AFM cantilever.

AFM Tip:


  • 3 AFM Cantilevers:

    Cantilever A
  • Beam
  • 0.8 N/m (0.3 - 2 N/m)*
  • 40 kHz (30 - 55 kHz)*
  • 250 µm (245 - 255 µm)*
  • 35 µm (32 - 38 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
  • Cantilever B
  • Beam
  • 0.3 N/m (0.1 - 0.6 N/m)*
  • 20 kHz (15 - 30 kHz)*
  • 350 µm (345 - 355 µm)*
  • 35 µm (32 - 38 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
  • Cantilever C
  • Beam
  • 0.4 N/m (0.1 - 1 N/m)*
  • 30 kHz (20 - 40 kHz)*
  • 300 µm (295 - 305 µm)*
  • 35 µm (32 - 38 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
  • * typical range
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