AFM probes of the 38 series have three different contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
AFM probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is below 35 nm. The coating may cause AFM cantilever bending within 3°.