AFM Probes » HQ:CSC38/Cr-Au

 Order
 Request a quote (RFQ)
Order Code / Price*
Quantity
HQ:CSC38/Cr-Au-15 Box of 15 AFM Probes
360.00 USD
Volume Discount Available [?]
HQ:CSC38/Cr-Au-50 Box of 50 AFM Probes
900.00 USD
Your volume discount is 300.00 USD or 25.00%
HQ:CSC38/Cr-Au-100 Box of 100 AFM Probes
1 620.00 USD
Your volume discount is 780.00 USD or 32.50%
Product availability: On stock
Get a free MikroMasch poster

HQ:CSC38/Cr-Au

AFM Probe with 3 Different Gold Coated Contact Mode AFM Cantilevers

Manufacturer: MikroMasch

Coating: Gold Overall
AFM tip shape: Rotated
This probe features 3 cantilevers
F 20 kHz
C 0.09 N/m
L 250 µm
F 10 kHz
C 0.03 N/m
L 350 µm
F 14 kHz
C 0.05 N/m
L 300 µm
*nominal values

Applications

How to optimize AFM scan parameters gear icon

AFM probes of the 38 series have three different contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications.

AFM probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is below 35 nm. The coating may cause AFM cantilever bending within 3°.

Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both tip side and back side of the AFM cantilever.

AFM Tip:


  • 3 AFM Cantilevers:

    Cantilever A
  • Beam
  • 0.09 N/m (0.01 - 0.36 N/m)*
  • 20 kHz (8 - 32 kHz)*
  • 250 µm (245 - 255 µm)*
  • 32.5 µm (29.5 - 35.5 µm)*
  • 1 µm ( 0.5 - 1.5 µm)*
  • Cantilever B
  • Beam
  • 0.03 N/m (0.003 - 0.13 N/m)*
  • 10 kHz (5 - 17 kHz)*
  • 350 µm (345 - 355 µm)*
  • 32.5 µm (29.5 - 35.5 µm)*
  • 1 µm ( 0.5 - 1.5 µm)*
  • Cantilever C
  • Beam
  • 0.05 N/m (0.005 - 0.21 N/m)*
  • 14 kHz (6 - 23 kHz)*
  • 300 µm (295 - 305 µm)*
  • 32.5 µm (29.5 - 35.5 µm)*
  • 1 µm ( 0.5 - 1.5 µm)*
  • * typical range
    Loading
    nanosensors-logo nanoworld-logo budgetsensors-logo mikromasch-logo opus-logo nanotools-logo