AFM Probes » HQ:DPE-XSC11

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Quantity
HQ:DPE-XSC11-15 Box of 15 AFM Probes
450.00 USD
Volume Discount Available [?]
HQ:DPE-XSC11-50 Box of 50 AFM Probes
1 150.00 USD
Your volume discount is 350.00 USD or 23.30%
HQ:DPE-XSC11-100 Box of 100 AFM Probes
2 100.00 USD
Your volume discount is 900.00 USD or 30.00%
Product availability: On stock
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HQ:DPE-XSC11

AFM Probe with 4 Different Electrical Cantilevers

Manufacturer: MikroMasch

Coating: Electrically Conductive
AFM tip shape: Rotated
This probe features 4 cantilevers
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
*nominal values

Applications

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AFM probes of the 11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used for various electrical measurements.

The DPE AFM probes have a special structure of conductive layers applied to the AFM tip that provides better signal to noise ratio on the scans of electric properties. The coating thickness is increased, which gives more freedom for using them in contact electrical modes. The AFM probes provide better performance and higher contrast of electrical signals, while the ability to resolve the small surface details might be reduced. The AFM probes can be used in dynamic electrical modes when a study of the electric properties of a sample has higher priority.

The conductive Pt coating covers the entire silicon chip, AFM cantilevers and AFM tips. It provides high conductivity and enhances the laser reflectivity.

AFM Tip:


  • 4 AFM Cantilevers:

    Cantilever A
  • Beam
  • 0.2 N/m (0.1 - 0.4 N/m)*
  • 15 kHz (12 - 18 kHz)*
  • 500 µm (495 - 505 µm)*
  • 30 µm (27 - 33 µm)*
  • 2.7 µm ( 2.2 - 3.2 µm)*
  • Cantilever B
  • Beam
  • 2.7 N/m (1.1 - 5.6 N/m)*
  • 80 kHz (60 - 100 kHz)*
  • 210 µm (205 - 215 µm)*
  • 30 µm (27 - 33 µm)*
  • 2.7 µm ( 2.2 - 3.2 µm)*
  • Cantilever C
  • Beam
  • 7 N/m (3 - 16 N/m)*
  • 155 kHz (115 - 200 kHz)*
  • 150 µm (145 - 155 µm)*
  • 30 µm (27 - 33 µm)*
  • 2.7 µm ( 2.2 - 3.2 µm)*
  • Cantilever D
  • Beam
  • 42 N/m (17 - 90 N/m)*
  • 350 kHz (250 - 465 kHz)*
  • 100 µm (95 - 105 µm)*
  • 50 µm (47 - 53 µm)*
  • 2.7 µm ( 2.2 - 3.2 µm)*
  • * typical range
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