Probes of the 11 series have four different cantilevers, two on each side of the holder chip. They can be used in various applications.
The DPE probes have a special structure of conducting layers applied to the tip that provides better signal to noise ratio on the scans of electric properties. The coating thickness is increased, which gives more freedom for using them in contact electrical modes. The probes provide better performance and higher contrast of electrical signals, while the ability to resolve the small surface details might be reduced. The probes can be used in electric AC modes when a study of the electric properties of a sample has higher priority.