AFM probes of the 11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used for various electrical measurements.
The DPE AFM probes have a special structure of conductive layers applied to the AFM tip that provides better signal to noise ratio on the scans of electric properties. The coating thickness is increased, which gives more freedom for using them in contact electrical modes. The AFM probes provide better performance and higher contrast of electrical signals, while the ability to resolve the small surface details might be reduced. The AFM probes can be used in dynamic electrical modes when a study of the electric properties of a sample has higher priority.
