AFM probes of the 11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used for various electrical measurements.
The DPER AFM probes are made by depositing a thin metal coating on Si AFM tips. The thickness of the coating on the flat AFM cantilever surface is about 15 nm, resulting in a coated AFM tip radius below 20 nm. The AFM probes can be used for imaging samples with higher resolution in XY directions.