AFM Probes » HQ:DPER-XSC11

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HQ:DPER-XSC11-15 Box of 15 AFM Probes
450.00 USD
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HQ:DPER-XSC11-50 Box of 50 AFM Probes
1 150.00 USD
Your volume discount is 350.00 USD or 23.30%
HQ:DPER-XSC11-100 Box of 100 AFM Probes
2 100.00 USD
Your volume discount is 900.00 USD or 30.00%
Product availability: On stock
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HQ:DPER-XSC11

AFM Probe with 4 Different Electrical AFM Cantilevers

Manufacturer: MikroMasch

Coating: Electrically Conductive
AFM tip shape: Rotated
This probe features 4 cantilevers
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
*nominal values

Applications

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AFM probes of the 11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used for various electrical measurements.

The DPER AFM probes are made by depositing a thin metal coating on Si AFM tips. The thickness of the coating on the flat AFM cantilever surface is about 15 nm, resulting in a coated AFM tip radius below 20 nm. The AFM probes can be used for imaging samples with higher resolution in XY directions.

The DPER AFM probes are made by depositing a thin Pt coating on both sides of the Si AFM cantilevers. The thickness of the coating on the flat AFM cantilever surface is about 15 nm.

AFM Tip:


  • 4 AFM Cantilevers:

    Cantilever A
  • Beam
  • 0.2 N/m (0.1 - 0.4 N/m)*
  • 15 kHz (12 - 18 kHz)*
  • 500 µm (495 - 505 µm)*
  • 30 µm (27 - 33 µm)*
  • 2.7 µm ( 2.2 - 3.2 µm)*
  • Cantilever B
  • Beam
  • 2.7 N/m (1.1 - 5.6 N/m)*
  • 80 kHz (60 - 100 kHz)*
  • 210 µm (205 - 215 µm)*
  • 30 µm (27 - 33 µm)*
  • 2.7 µm ( 2.2 - 3.2 µm)*
  • Cantilever C
  • Beam
  • 7 N/m (3 - 16 N/m)*
  • 155 kHz (115 - 200 kHz)*
  • 150 µm (145 - 155 µm)*
  • 30 µm (27 - 33 µm)*
  • 2.7 µm ( 2.2 - 3.2 µm)*
  • Cantilever D
  • Beam
  • 42 N/m (17 - 90 N/m)*
  • 350 kHz (250 - 465 kHz)*
  • 100 µm (95 - 105 µm)*
  • 50 µm (47 - 53 µm)*
  • 2.7 µm ( 2.2 - 3.2 µm)*
  • * typical range
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