AFM Probes » HQ:NSC14/Hard/Al BS

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HQ:NSC14/Hard/Al BS-15 Box of 15 AFM Probes
390.00 USD
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HQ:NSC14/Hard/Al BS-50 Box of 50 AFM Probes
1 000.00 USD
Your volume discount is 300.00 USD or 23.10%
Product availability: On stock
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HQ:NSC14/Hard/Al BS

Long Scanning, DLC Hardened, Soft Tapping Mode AFM Probe

Coating: Hard Diamond-Like-Carbon
Tip shape: Rotated
Cantilever:
F 160 kHz
C 5 N/m
L 125 µm
*nominal values

Applications

Cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by tip tapping. Probes with coatings can also be used in conductive AFM techniques.

A wear-resistant coating with thickness 20 nm is applied to the tipside of the cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.

This product features alignment grooves on the back side of the holder chip.

Wear-resistant coating with thickness 20 nm on the tipside of the cantilever. Al coating with thickness 30nm on the backside of the cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 5 N/m (1.8 - 13 N/m)*
  • 160 kHz (110 - 220 kHz)*
  • 125 µm (120 - 130 µm)*
  • 25 µm (22 - 28 µm)*
  • 2.1 µm (1.6 - 2.6 µm)*
  • * typical range
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