AFM Probes » HQ:NSC14/Hard/Al BS

 Order
 Request a quote (RFQ)
Order Code / Price*
Quantity
HQ:NSC14/Hard/Al BS-15 Box of 15 AFM Probes
390.00 USD
HQ:NSC14/Hard/Al BS-50 Box of 50 AFM Probes
1000.00 USD
Your volume discount is 300.00 USD or 23.10%
Product availability: On stock
Get a free MikroMasch poster

HQ:NSC14/Hard/Al BS

Long Scanning, DLC Hardened, Soft Tapping Mode AFM Probe

Manufacturer: MikroMasch

Coating: Hard Diamond-Like-Carbon
AFM tip shape: Rotated
AFM Cantilever
F 160 kHz
C 5 N/m
L 125 µm
*nominal values

Applications

How to optimize AFM scan parameters gear icon

AFM cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by the tapping AFM tip. AFM probes with coatings can also be used in conductive AFM techniques.

A wear-resistant coating with thickness 20 nm is applied to the tip side of the AFM cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.

This product features alignment grooves on the back side of the holder chip.

Wear-resistant coating with thickness 20 nm on the tip side of the AFM cantilever. Al coating with thickness 30nm on the back side of the AFM cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 5 N/m (1.8 - 13 N/m)*
  • 160 kHz (110 - 220 kHz)*
  • 125 µm (120 - 130 µm)*
  • 25 µm (22 - 28 µm)*
  • 2.1 µm ( 1.6 - 2.6 µm)*
  • * typical range
    Loading
    nanosensors-logo
    nanoworld-logo
    budgetsensors-logo
    mikromasch-logo
    opus-logo
    nanotools-logo