AFM cantilevers of the 18 series are optimal for Lift mode operation AFM since they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These AFM cantilevers are also used for mapping of materials properties in Force modulation mode and true topography imaging of the soft samples in Soft tapping mode.
The coating consists of a Co layer on the tip side of the AFM cantilever. The Co layer is formed as a polycrystalline film, which allows steady permanent magnetization in the direction of the tip axis. All AFM probes are pre-magnetized at the facility before shipping to end users. In some cases additional magnetization by an arbitrary strong magnet is required, e.g. SmCo or NdFeB.
The Co coating is protected from oxidation by a thin Cr layer, resulting in longer AFM cantilever performance.
This AFM probe features alignment grooves on the back side of the holder chip.