AFM cantilevers of the 18 series are optimal for Lift mode operation AFM since they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These AFM cantilevers are also used for mapping of materials properties in Force modulation mode and true topography imaging of the soft samples in Soft tapping mode.
A wear-resistant coating with thickness 20 nm is applied to the tip side of the AFM cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.
This AFM probe features alignment grooves on the back side of the holder chip.