AFM Probes » HQ:NSC18/Hard/Al BS

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HQ:NSC18/Hard/Al BS-15 Box of 15 AFM Probes
390.00 USD
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HQ:NSC18/Hard/Al BS-50 Box of 50 AFM Probes
1 000.00 USD
Your volume discount is 300.00 USD or 23.10%
Product availability: On stock
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HQ:NSC18/Hard/Al BS

Long Scanning, DLC Hardened Force Modulation AFM Probe

Manufacturer: MikroMasch

Coating: Hard Diamond-Like-Carbon
AFM tip shape: Rotated
AFM Cantilever
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values

Applications

How to optimize AFM scan gear icon

AFM cantilevers of the 18 series are optimal for Lift mode operation AFM since they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These AFM cantilevers are also used for mapping of materials properties in Force modulation mode and true topography imaging of the soft samples in Soft tapping mode.

A wear-resistant coating with thickness 20 nm is applied to the tip side of the AFM cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.

This product features alignment grooves on the back side of the holder chip.

Wear-resistant coating with thickness 20 nm on the tip side of the AFM cantilever. Al coating with thickness 30nm on the back side of the AFM cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2.8 N/m (1.2 - 5.5 N/m)*
  • 75 kHz (60 - 90 kHz)*
  • 225 µm (220 - 230 µm)*
  • 27.5 µm (24.5 - 30.5 µm)*
  • 3 µm ( 2.5 - 3.5 µm)*
  • * typical range
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