AFM Probes » HQ:NSC18/Hard/Al BS

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HQ:NSC18/Hard/Al BS-15 Box of 15 AFM Probes
390.00 USD
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HQ:NSC18/Hard/Al BS-50 Box of 50 AFM Probes
1 000.00 USD
Your volume discount is 300.00 USD or 23.10%
Product availability: On stock
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HQ:NSC18/Hard/Al BS

Long Scanning, DLC Hardened Force Modulation AFM Probe

Coating: Reflex Gold
Tip shape: Supersharp
Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values

Applications

Cantilevers of the 18 series are optimal for the Lift mode operation AFM as they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These cantilevers are also used for mapping of materials properties in Force modulation mode and the true topography imaging of the soft samples.

A wear-resistant coating with thickness 20 nm is applied to the tipside of the cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.

This product features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2.8 N/m (1.2 - 5.5 N/m)*
  • 75 kHz (60 - 90 kHz)*
  • 225 µm (220 - 230 µm)*
  • 27.5 µm (24.5 - 30.5 µm)*
  • 3 µm (2.5 - 3.5 µm)*
  • * typical range
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