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HQ:NSC35/Cr-Au-15 Box of 15 AFM Probes
460.00 USD
HQ:NSC35/Cr-Au-50 Box of 50 AFM Probes
1250.00 USD
Your volume discount is 283.33 USD or 18.50%
HQ:NSC35/Cr-Au-100 Box of 100 AFM Probes
2250.00 USD
Your volume discount is 816.67 USD or 26.60%
Product availability: On stock
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HQ:NSC35/Cr-Au

AFM Probe with 3 Different Gold Coated Tapping Mode AFM Cantilevers

Manufacturer: MikroMasch

Coating: Gold Overall
AFM tip shape: Rotated
This probe features 3 cantilevers
F 205 kHz
C 8.9 N/m
L 110 µm
F 300 kHz
C 16 N/m
L 90 µm
F 150 kHz
C 5.4 N/m
L 130 µm
*nominal values
Applications
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AFM probes of the 35 series have three different tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications.

AFM probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is below 35 nm. The coating may cause AFM cantilever bending within 3°.

Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both tip side and back side of the AFM cantilever.
AFM Tip:

  • 3 AFM Cantilevers:
    Cantilever A
  • Beam
  • 8.9 N/m (2.7 - 24 N/m)*
  • 205 kHz (130 - 290 kHz)*
  • 110 µm (105 - 115 µm)*
  • 35 µm (32 - 38 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
  • Cantilever B
  • Beam
  • 16 N/m (4.8 - 44 N/m)*
  • 300 kHz (185 - 430 kHz)*
  • 90 µm (85 - 95 µm)*
  • 35 µm (32 - 38 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
  • Cantilever C
  • Beam
  • 5.4 N/m (1.7 - 14 N/m)*
  • 150 kHz (95 - 205 kHz)*
  • 130 µm (125 - 135 µm)*
  • 35 µm (32 - 38 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
  • * typical range
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