AFM Probes » HQ:NSC35/Pt

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Quantity
HQ:NSC35/Pt-15 Box of 15 AFM Probes
360.00 USD
Volume Discount Available [?]
HQ:NSC35/Pt-50 Box of 50 AFM Probes
900.00 USD
Your volume discount is 300.00 USD or 25.00%
HQ:NSC35/Pt-100 Box of 100 AFM Probes
1 620.00 USD
Your volume discount is 780.00 USD or 32.50%
Product availability: On stock
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HQ:NSC35/Pt

AFM Probe with 3 Different Electrical, Tapping Mode Cantilevers

Coating: Electrically Conductive
Tip shape: Rotated
This probe features 3 cantilevers
F 205 kHz
C 8.9 N/m
L 110 µm
F 300 kHz
C 16 N/m
L 90 µm
F 150 kHz
C 5.4 N/m
L 130 µm
*nominal values

Applications

Probes of the 35 series have three different tapping mode cantilevers on one side of the holder chip. They are suitable for different electrical measurements.

Probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the cantilever. Resulting probe tip radius is about 30 nm.

This product features alignment grooves on the back side of the holder chip.

The 30 nm conducting Pt coating is continuous from the tip end to the bulk of the Silicon chip. The coating covers both the tip and the back side.

AFM Tip:


  • 3 AFM Cantilevers:

    Cantilever A
  • Beam
  • 8.9 N/m (2.7 - 24 N/m)*
  • 205 kHz (130 - 290 kHz)*
  • 110 µm
  • 35 µm
  • 2 µm
  • Cantilever B
  • Beam
  • 16 N/m (4.8 - 44 N/m)*
  • 300 kHz (185 - 430 kHz)*
  • 90 µm
  • 35 µm
  • 2.0 µm
  • Cantilever C
  • Beam
  • 5.4 N/m (1.7 - 14 N/m)*
  • 150 kHz (95 - 205 kHz)*
  • 130 µm
  • 35 µm
  • 2.0 µm
  • * typical range
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