AFM Probes » HQ:NSC35/Pt

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HQ:NSC35/Pt-15 Box of 15 AFM Probes
360.00 USD
HQ:NSC35/Pt-50 Box of 50 AFM Probes
900.00 USD
Your volume discount is 300.00 USD or 25.00%
HQ:NSC35/Pt-100 Box of 100 AFM Probes
1620.00 USD
Your volume discount is 780.00 USD or 32.50%
Product availability: On stock
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HQ:NSC35/Pt

AFM Probe with 3 Different Electrical, Tapping Mode AFM Cantilevers

Manufacturer: MikroMasch

Coating: Electrically Conductive
AFM tip shape: Rotated
This probe features 3 cantilevers
F 205 kHz
C 8.9 N/m
L 110 µm
F 300 kHz
C 16 N/m
L 90 µm
F 150 kHz
C 5.4 N/m
L 130 µm
*nominal values

Applications

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AFM probes of the 35 series have three different tapping mode AFM cantilevers on one side of the holder chip. They can be used for various electrical measurements.

AFM probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is about 30 nm.

The 30 nm conductive Pt coating is continuous from the tip end to the bulk of the silicon chip. The coating covers both the tip and the back side of the AFM cantilever.

AFM Tip:


  • 3 AFM Cantilevers:

    Cantilever A
  • Beam
  • 8.9 N/m (2.7 - 24 N/m)*
  • 205 kHz (130 - 290 kHz)*
  • 110 µm (105 - 115 µm)*
  • 35 µm (32 - 38 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
  • Cantilever B
  • Beam
  • 16 N/m (4.8 - 44 N/m)*
  • 300 kHz (185 - 430 kHz)*
  • 90 µm (85 - 95 µm)*
  • 35 µm (32 - 38 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
  • Cantilever C
  • Beam
  • 5.4 N/m (1.7 - 14 N/m)*
  • 150 kHz (95 - 205 kHz)*
  • 130 µm (125 - 135 µm)*
  • 35 µm (32 - 38 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
  • * typical range
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