AFM Probes » HQ:XSC11/Pt

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Order Code / Price*
Quantity
HQ:XSC11/Pt-15 Box of 15 AFM Probes
390.00 USD
Volume Discount Available [?]
HQ:XSC11/Pt-50 Box of 50 AFM Probes
1 000.00 USD
Your volume discount is 300.00 USD or 23.10%
HQ:XSC11/Pt-100 Box of 100 AFM Probes
1 800.00 USD
Your volume discount is 800.00 USD or 30.80%
Product availability: On stock
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HQ:XSC11/Pt

AFM Probe with 4 Different Electrical Cantilevers

Coating: Electrically Conductive
Tip shape: Rotated
This probe features 4 cantilevers
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
*nominal values

Applications

Probes of the 11 series have four different cantilevers, two on each side of the holder chip. They can be used in various applications.

Probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the cantilever. Resulting probe tip radius is about 30 nm.

This product features alignment grooves on the back side of the holder chip.

The 30 nm conducting Pt coating is continuous from the tip end to the bulk of the Silicon chip. The coating covers both the tip and the back side.

AFM Tip:


  • 4 AFM Cantilevers:

    Cantilever A
  • Beam
  • 0.2 N/m (0.1 - 0.4 N/m)*
  • 15 kHz (12 - 18 kHz)*
  • 500 µm
  • 30 µm
  • 2.7 µm
  • Cantilever B
  • Beam
  • 2.7 N/m (1.1 - 5.6 N/m)*
  • 80 kHz (60 - 100 kHz)*
  • 210 µm
  • 30 µm
  • 2.7 µm
  • Cantilever C
  • Beam
  • 7 N/m (3 - 16 N/m)*
  • 155 kHz (115 - 200 kHz)*
  • 150 µm
  • 30 µm
  • 2.7 µm
  • Cantilever D
  • Beam
  • 42 N/m (17 - 90 N/m)*
  • 350 kHz (250 - 465 kHz)*
  • 100 µm
  • 50 µm
  • 2.7 µm
  • * typical range
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