AFM Probes » HQ:NSC36/tipless/Cr-Au

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HQ:NSC36/tipless/Cr-Au-15 Box of 15 AFM Probes
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HQ:NSC36/tipless/Cr-Au-50 Box of 50 AFM Probes
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HQ:NSC36/tipless/Cr-Au

Tipless AFM Probe with 3 Different Gold Coated Force Modulation AFM Cantilevers

Manufacturer: MikroMasch

Coating: Gold Overall
AFM tip shape: Tipless
This probe features 3 cantilevers
F 90 kHz
C 1 N/m
L 110 µm
F 130 kHz
C 2 N/m
L 90 µm
F 65 kHz
C 0.6 N/m
L 130 µm
*nominal values

Applications

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AFM probes of the 36 series have three different Force modulation mode cantilevers on one side of the holder chip. They can be used in various applications.

AFM probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on both sides of the AFM cantilever. The coating may cause AFM cantilever bending within 3°.

Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both sides of the AFM cantilever.

AFM Tip:


  • 3 AFM Cantilevers:

    Cantilever A
  • Beam
  • 1 N/m (0.1 - 4.6 N/m)*
  • 90 kHz (30 - 160 kHz)*
  • 110 µm (105 - 115 µm)*
  • 32.5 µm (29.5 - 35.5 µm)*
  • 1 µm ( 0.5 - 1.5 µm)*
  • Cantilever B
  • Beam
  • 2 N/m (0.2 - 9 N/m)*
  • 130 kHz (45 - 240 kHz)*
  • 90 µm (85 - 95 µm)*
  • 32.5 µm (29.5 - 35.5 µm)*
  • 1 µm ( 0.5 - 1.5 µm)*
  • Cantilever C
  • Beam
  • 0.6 N/m (0.06 - 2.7 N/m)*
  • 65 kHz (25 - 115 kHz)*
  • 130 µm (125 - 135 µm)*
  • 32.5 µm (29.5 - 35.5 µm)*
  • 1 µm ( 0.5 - 1.5 µm)*
  • * typical range
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