AFM Probes » AR5-NCH

 Order
 Request a quote (RFQ)
Order Code / Price*
Quantity
AR5-NCH-10 Box of 10 AFM Probes
889.00 USD
AR5-NCH-50 Box of 50 AFM Probes
3508.00 USD
Your volume discount is 937.00 USD or 21.10%
AR5-NCH-W Box of 370 AFM Probes
17304.00 USD
Your volume discount is 15589.00 USD or 47.40%
Product availability: On stock

AR5-NCH

High-Aspect-Ratio, Tapping Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: none
AFM tip shape: High-Aspect-Ratio
AFM Cantilever
F 330 kHz
C 42 N/m
L 125 µm
*nominal values

Applications

How to optimize AFM scan parameters gear icon

NANOSENSORS™ AR5-NCH AFM tips are designed for non-contact mode or tapping mode AFM. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored AFM tips. These AFM tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 5:1 at the end of the common silicon AFM tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the AFM tip.

The AFM probe offers unique features:

  • length of the high aspect ratio portion of the AFM tip > 2 µm
  • typical aspect ratio at 2 µm in the order of 7:1 (when viewed from side as well as along AFM cantilever axis)
  • excellent AFM tip radius of curvature
  • monolithic AFM tip
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity

This product features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 42 N/m (10 - 130 N/m)*
  • 330 kHz (204 - 497 kHz)*
  • 125 µm (115 - 135 µm)*
  • 30 µm (30 - 45 µm)*
  • 4 µm ( 3 - 5 µm)*
  • * typical range
    Loading
    nanosensors-logo
    nanoworld-logo
    budgetsensors-logo
    mikromasch-logo
    opus-logo
    nanotools-logo