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AFM Probes  »  
Focused Ion Beam AFM Tips
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Focused Ion Beam AFM Tips

AFM probes with focused ion beam (FIB) high aspect ratio spike active part of the AFM tips
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8 results
AR10-NCHR NANOSENSORS
AR10-NCHR
High-Aspect-Ratio, Tapping Mode AFM Probe
Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
330 kHz
C
42 N/m
L
125 µm
AR5-NCHR NANOSENSORS
AR5-NCHR
High-Aspect-Ratio, Tapping Mode AFM Probe
Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
330 kHz
C
42 N/m
L
125 µm
AR5-NCH NANOSENSORS
AR5-NCH
High-Aspect-Ratio, Tapping Mode AFM Probe
Coating: none
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
330 kHz
C
42 N/m
L
125 µm
NW-AR10-NCHR NanoWorld
NW-AR10-NCHR
High-Aspect-Ratio, Tapping Mode AFM Probe
Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
320 kHz
C
42 N/m
L
125 µm
NW-AR5-NCHR NanoWorld
NW-AR5-NCHR
High-Aspect-Ratio, Tapping Mode AFM Probe
Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
320 kHz
C
42 N/m
L
125 µm
AR5-NCLR NANOSENSORS
AR5-NCLR
High-Aspect-Ratio, Tapping Mode AFM Probe with Long AFM Cantilever
Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
NW-AR5-NCLR NanoWorld
NW-AR5-NCLR
High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever
Coating: Reflective Aluminum
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
190 kHz
C
48 N/m
L
225 µm
NANOSENSORS™ Special Developments List (SDL) NANOSENSORS
NANOSENSORS™ Special Developments List (SDL)
Special AFM Probes etc. Showcasing NANOSENSORS™ Expertise
Coating: various
Tip Shape: various
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OLYMPUS® is a trademark of Olympus Corporation