AFM Probes » ARROW-UHF

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Order Code / Price*
Quantity
ARROW-UHF-10 Box of 10 AFM Probes
600.00 USD
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ARROW-UHF-20 Box of 20 AFM Probes
1 200.00 USD
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Product availability: On stock

ARROW-UHF

Ultra High Frequency AFM Probe with Tip at the Very End of the Cantilever

Coating: Reflex Aluminum
Tip shape: Arrow
Cantilever:
F 2000 kHz
C 0
L 35 µm
*nominal values

Applications

Optimized positioning through maximized tip visibility

NanoWorld Arrow™ ultra high frequency AFM probes are capable of resonating with a very high frequency of up to 1.5 MHz. This probe type combines outstanding sensitivity with fast scanning ability.

All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip.

Additionally, this AFM probe offers an excellent tip radius of curvature.

The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

If needed, specific cantilever thicknesses can be selected within very narrow tolerances for an additional selection fee.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • -
  • 2000 kHz (700 - 2000 kHz)*
  • 35 µm
  • 42 µm
  • 700 nm (500 - 900 nm)*
  • * typical range
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