AFM Probes » CDT-CONTR

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Order Code / Price*
Quantity
CDT-CONTR-10 Box of 10 AFM Probes
1 481.00 USD
Volume Discount Available [?]
CDT-CONTR-20 Box of 20 AFM Probes
2 650.00 USD
Your volume discount is 312.00 USD or 10.50%
CDT-CONTR-50 Box of 50 AFM Probes
5 846.00 USD
Your volume discount is 1 559.00 USD or 21.10%
Product availability: On stock

CDT-CONTR

Diamond Coated, Conductive Contact Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: Diamond,Conductive Diamond
AFM tip shape: Standard
AFM Cantilever
F 20 kHz
C 0.5 N/m
L 450 µm
*nominal values

Applications

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NANOSENSORS™ CDT-CONTR AFM probes are designed for contact mode (repulsive mode) SPM imaging.

For applications that require a wear resistant and an electrically conductive AFM tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

The typical macroscopic AFM tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.

The AFM probe offers unique features:

  • real diamond coating, highly doped
  • high mechanical Q-factor for high sensitivity

This product features alignment grooves on the back side of the holder chip.

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. The virtually stress-free coating is bending the AFM cantilever less than 3.5% of the AFM cantilever length.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.5 N/m (0.1 - 1.7 N/m)*
  • 20 kHz (11 - 29 kHz)*
  • 450 µm (440 - 460 µm)*
  • 50 µm (42.5 - 57.5 µm)*
  • 2 µm ( 1 - 3 µm)*
  • * typical range
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