NANOSENSORS™ CDT-FMR AFM probes are designed for force modulation microscopy. The force constant of this AFM probe type spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The FM sensor serves also as a basis for magnetic coatings (MFM). Furthermore non-contact or tapping mode operation is possible with the FM probe but with reduced operation stability.
For applications that require a wear resistant and an electrically conductive AFM tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.
The typical macroscopic AFM tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.
The AFM probe offers unique features:
This AFM probe features alignment grooves on the back side of the holder chip.