AFM Probes » CONT

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Order Code / Price*
Quantity
CONT-10 Box of 10 AFM Probes
279.00 USD
CONT-50 Box of 50 AFM Probes
1 104.00 USD
Your volume discount is 291.00 USD or 20.90%
CONT-W Box of 385 AFM Probes
5 672.00 USD
Your volume discount is 5 069.50 USD or 47.20%
Product availability: On stock

CONT

Standard Contact Mode AFM Probe

Coating: none
Tip shape: Standard
Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values

Applications

NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.

All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probe offers an excellent tip radius of curvature.

This product features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.07 - 0.4 N/m)*
  • 13 kHz (9 - 17 kHz)*
  • 450 µm (445 - 455 µm)*
  • 50 µm (45 - 55 µm)*
  • 2 µm (1.5 - 2.5 µm)*
  • * typical range
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