AFM Probes »

CONT

Order Code / Price*

Quantity

CONT-10 Box of 10 AFM Probes

335 335.00 USD

Volume Discount Available [?]

CONT-20 Box of 20 AFM Probes

600 600.00 USD

Your volume discount is 70.00 USD or 10.40%

CONT-50 Box of 50 AFM Probes

1324 1324.00 USD

Your volume discount is 351.00 USD or 21.00%

CONT-W Box of 380 AFM Probes

7050 7050.00 USD

Your volume discount is 5680.00 USD or 44.60%

Product availability: On stock

SEM image of PointProbe® Plus AFM tip

CONT

Name: CONT-10 Standard Contact Mode AFM Probe
Brand: NanoWorld
SKU: CONT-10
Price: 335 USD
Availability: InStock

Standard Contact Mode AFM Probe

Manufacturer: NanoWorld

Coating: none
AFM tip shape: Standard

AFM Cantilever

F 13 kHz

C 0.2 N/m

L 450 µm

*nominal values

Applications

Contact Mode AFM Probes

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

NanoWorld Pointprobe® CONT AFM probes are designed for contact mode imaging. Furthermore this AFM probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.

All AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally, this AFM probe offers an excellent tip radius of curvature.

This AFM probe features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:

Shape: Standard

Radius: < 8 nm (< 12 nm guaranteed)

AFM Cantilever:

Shape: Beam

Force Constant: 0.2 N/m (0.07 - 0.4 N/m)*

Resonance Frequency: 13 kHz (9 - 17 kHz)*

Length: 450 µm (445 - 455 µm)*

Width: 50 µm (45 - 55 µm)*

Thickness: 2 µm ( 1.5 - 2.5 µm)*

* typical range