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CONTSCR

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Order Code / Price*
Quantity
CONTSCR-10 Box of 10 AFM Probes
335.00 USD
CONTSCR-50 Box of 50 AFM Probes
1324.00 USD
Your volume discount is 351.00 USD or 21.00%
CONTSCR-W Box of 380 AFM Probes
7050.00 USD
Your volume discount is 5680.00 USD or 44.60%
Product availability: On stock

CONTSCR

Contact Mode AFM Probe with Short Cantilever

Manufacturer: NanoWorld

Coating: Reflective Aluminum
AFM tip shape: Standard
AFM Cantilever
F 25 kHz
C 0.2 N/m
L 225 µm
*nominal values

Applications

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NanoWorld Pointprobe® CONTSCR AFM probe is an alternative AFM cantilever type for contact mode applications. The length of the AFM cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode AFM probes for some AFM instruments. Additionally, this AFM probe type allows the application for lateral or friction force mode.

All SPM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally, this AFM probe offers an excellent tip radius of curvature.

This AFM probe features alignment grooves on the back side of the holder chip.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.

As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.02 - 0.7 N/m)*
  • 25 kHz (10 - 39 kHz)*
  • 225 µm (220 - 230 µm)*
  • 48 µm (42.5 - 52.5 µm)*
  • 1 µm ( 0.5 - 1.5 µm)*
  • * typical range
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