AFM Probes » CONTSCR

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Order Code / Price*
Quantity
CONTSCR-10 Box of 10 AFM Probes
307.00 USD
CONTSCR-50 Box of 50 AFM Probes
1 215.00 USD
Your volume discount is 320.00 USD or 20.80%
CONTSCR-W Box of 380 AFM Probes
6 239.00 USD
Your volume discount is 5 427.00 USD or 46.50%
Product availability: On stock

CONTSCR

Contact Mode AFM Probe with Short Cantilever

Coating: Reflex Aluminum
Tip shape: Standard
Cantilever:
F 25 kHz
C 0.2 N/m
L 225 µm
*nominal values

Applications

NanoWorld Pointprobe® CONTSCR AFM probe is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

All SPM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probe offers an excellent tip radius of curvature.

This product features alignment grooves on the back side of the holder chip.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.02 - 0.7 N/m)*
  • 25 kHz (10 - 39 kHz)*
  • 225 µm (220 - 230 µm)*
  • 48 µm (42.5 - 52.5 µm)*
  • 1 µm (500 - 1.5 µm)*
  • * typical range
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