This colloidal probe combines the well-known features of the proven NANOSENSORS™ Cont series such as high application versatility and compatibility with most commercial SPMs with a reproducible sphere radius instead of a sharp tip. The excellent radius and the minimized variation of diameter provide reproducible signals.
CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
The so called "Colloidal Probe Technique", where single colloids are attached with polymer glue to AFM cantilevers for force measurements, offers possibilities for a better understanding of fundamental interactions in a variety of fields. Examples are adhesion phenomena, particle-surface-interactions, mechanical properties, suspensions, hydrodynamics and boundary slip - to name just some out of an increasing number of applications.
The probe offers unique features:
This product features alignment grooves on the back side of the holder chip.