CP-CONT-BSG

This colloidal probe combines the well-known features of the proven NANOSENSORS™ Cont series such as high application versatility and compatibility with most commercial SPMs with a reproducible sphere radius instead of a sharp tip. The excellent  radius and the minimized variation of diameter provide reproducible signals.

CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

The so called "Colloidal Probe Technique", where single colloids are attached with polymer glue to AFM cantilevers for force measurements, offers possibilities for a better understanding of fundamental interactions in a variety of fields. Examples are adhesion phenomena, particle-surface-interactions, mechanical properties, suspensions, hydrodynamics and boundary slip - to name just some out of an increasing number of applications.

The probe offers unique features:

• sphere material: borosilicate glass
• excellent sphere diameter: A = 5 µm, B = 10 µm, C = 20 µm (all +/- 10%)
  (Due to different masses the resonance frequency can differ.)
  Please choose A, B, or C when ordering!
• highly doped silicon cantilever to dissipate static charge, chemically inert to most common solvents
• high mechanical Q-factor for high sensitivity
• precise alignment of the cantilever position when used together the Alignment chip (within +/- 2 µm)
• compatible with PointProbe® Plus XY-Alignment Series

This product features alignment grooves on the back side of the holder chip.