This colloidal probe combines the well-known features of the proven NANOSENSORS™ Cont AFM probes series such as high application versatility and compatibility with most commercial SPMs with a reproducible sphere radius instead of a sharp AFM tip.
CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
The so called "Colloidal Probe Technique", where single colloids are attached with polymer glue to AFM cantilevers for force measurements, offers possibilities for a better understanding of fundamental interactions in a variety of fields. Examples are adhesion phenomena, particle-surface interactions, mechanical properties, suspensions, hydrodynamics and boundary slip - to name just some out of an increasing number of applications.
The AFM probe offers unique features:
This AFM probe features alignment grooves on the back side of the holder chip.