CP-CONT-PM

This colloidal probe combines the well-known features of the proven NANOSENSORS™ Cont AFM probes series such as high application versatility and compatibility with most commercial SPMs with a reproducible sphere radius instead of a sharp AFM tip.

CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

The so called "Colloidal Probe Technique", where single colloids are attached with polymer glue to AFM cantilevers for force measurements, offers possibilities for a better understanding of fundamental interactions in a variety of fields. Examples are adhesion phenomena, particle-surface interactions, mechanical properties, suspensions, hydrodynamics and boundary slip - to name just some out of an increasing number of applications.

The AFM probe offers unique features:

• sphere material: polymethylmethacrylate (PMMA)
• excellent sphere diameter: A = 1.5 µm, B = 3.36 µm, C = 6.44 µm, D = 9.57 µm, or E = 14.59 µm, (all +/- 5%)
  (Due to different masses the resonance frequency can differ.)
  Please choose A, B, C, D, or E  when ordering!
• highly doped silicon AFM cantilever to dissipate static charge, chemically inert to most common solvents
• high mechanical Q-factor for high sensitivity
• precise alignment of the AFM cantilever position when used together with the Alignment chip (within +/- 2 µm)
• compatible with PointProbe® Plus XY-Alignment Series

This AFM probe features alignment grooves on the back side of the holder chip.