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CP-CONT-SiO

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Order Code / Price*
Quantity
CP-CONT-SiO-A-5 Box of 5 AFM Probes
549.00 USD
sphere Ø = 2 µm
CP-CONT-SiO-B-5 Box of 5 AFM Probes
549.00 USD
sphere Ø = 3.5 µm
CP-CONT-SiO-C-5 Box of 5 AFM Probes
549.00 USD
sphere Ø = 6.62 µm
CP-CONT-SiO-D-5 Box of 5 AFM Probes
549.00 USD
sphere Ø = 10.2 µm
CP-CONT-SiO-E-5 Box of 5 AFM Probes
549.00 USD
sphere Ø = 15 µm
Product availability: Made-to-order

CP-CONT-SiO

Colloidal AFM probe, AFM cantilever with round AFM tip like a ball

Coating: none
AFM tip shape: Sphere, Silicon Dioxide
Sphere Diameter: 2 - 15 µm
AFM Cantilever
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values

Applications

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This colloidal probe combines the well-known features of the proven NANOSENSORS™ Cont AFM probes series such as high application versatility and compatibility with most commercial SPMs with a reproducible sphere radius instead of a sharp AFM tip.

CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

The so called "Colloidal Probe Technique", where single colloids are attached with polymer glue to AFM cantilevers for force measurements, offers possibilities for a better understanding of fundamental interactions in a variety of fields. Examples are adhesion phenomena, particle-surface interactions, mechanical properties, suspensions, hydrodynamics and boundary slip - to name just some out of an increasing number of applications.

The AFM probe offers unique features:

  • sphere material: silicon dioxide (SiO2)
  • excellent sphere diameter: A = 2 µm, B = 3.5 µm, C = 6.62 µm, D = 10.2 µm, or E = 15 µm (all +/- 5%)
    (Due to different masses the resonance frequency can differ.)
    Please choose A, B, C, D, or E  when ordering!
  • highly doped silicon AFM cantilever to dissipate static charge, chemically inert to most common solvents
  • high mechanical Q-factor for high sensitivity
  • precise alignment of the AFM cantilever position when used together with the Alignment chip (within +/- 2 µm)
  • compatible with PointProbe® Plus XY-Alignment Series

This product features alignment grooves on the back side of the holder chip.

None

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.02 - 0.77 N/m)*
  • 13 kHz (6 - 21 kHz)*
  • 450 µm (440 - 460 µm)*
  • 50 µm (42.5 - 57.5 µm)*
  • 2 µm ( 1 - 3 µm)*
  • * typical range
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