Micromachined monolithic silicon AFM probe for contact mode and lateral force microscopy (LFM) operation.
The consistent AFM tip radius of less than 10 nm ensures high resolution and good reproducibility. The rotated AFM tip provides more symmetric representation of high sample features.
The AFM probe features a reflective gold coating on the back side of the AFM cantilever.
With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems.
Consistent high quality at a lower price!
This AFM probe features alignment grooves on the back side of the holder chip.