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ContGD-G

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ContGD-G-10 Box of 10 AFM Probes
260.00 USD
Product availability: On stock

ContGD-G

Gold Coated Contact Mode AFM Probe

Manufacturer: BudgetSensors

Coating: Reflective Gold
AFM tip shape: Rotated
AFM Cantilever
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values

Applications

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Micromachined monolithic silicon AFM probe for contact mode and lateral force microscopy (LFM) operation.

The consistent AFM tip radius of less than 10 nm ensures high resolution and good reproducibility. The rotated AFM tip provides more symmetric representation of high sample features.

The AFM probe features a reflective gold coating on the back side of the AFM cantilever.

With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems.

Consistent high quality at a lower price!

This AFM probe features alignment grooves on the back side of the holder chip.

Gold coating on detector side of the cantilever, 70 nm thick

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.07 - 0.4 N/m)*
  • 13 kHz (9 - 17 kHz)*
  • 450 µm (440 - 460 µm)*
  • 50 µm (45 - 55 µm)*
  • 2 µm ( 1 - 3 µm)*
  • * typical range
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