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Order Code / Price*
Quantity
ESPA-10 Box of 10 AFM Probes
307.00 USD
ESPA-50 Box of 50 AFM Probes
1215.00 USD
Your volume discount is 320.00 USD or 20.80%
ESPA-W Box of 380 AFM Probes
6239.00 USD
Your volume discount is 5427.00 USD or 46.50%
Product availability: On stock

ESPA

Standard Contact Mode AFM Probe

Manufacturer: NanoWorld

Coating: Reflex Aluminum
AFM tip shape: Standard
AFM Cantilever
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values

Applications

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NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.

All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probe offers an excellent tip radius of curvature.

This AFM probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acquired Veeco metrology business, is no longer selling the original probe which has always been manufactured by NanoWorld®.

This product features alignment grooves on the back side of the holder chip.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.

As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.07 - 0.4 N/m)*
  • 13 kHz (9 - 17 kHz)*
  • 450 µm (445 - 455 µm)*
  • 50 µm (45 - 55 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
  • * typical range
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