AFM Probes » NCHPt

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Order Code / Price*
Quantity
NCHPt-10 Box of 10 AFM Probes
419.00 USD
NCHPt-50 Box of 50 AFM Probes
1 657.00 USD
Your volume discount is 438.00 USD or 20.90%
NCHPt-W Box of 380 AFM Probes
8 508.00 USD
Your volume discount is 7 414.00 USD or 46.60%
Product availability: On stock

NCHPt

Electrical, Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip shape: Standard
Cantilever:
F 320 kHz
C 42 N/m
L 125 µm
*nominal values

Applications

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probe offers an excellent tip radius of curvature.

This product features alignment grooves on the back side of the holder chip.

PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at the tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 42 N/m (21 - 78 N/m)*
  • 320 kHz (250 - 390 kHz)*
  • 125 µm (120 - 130 µm)*
  • 30 µm (25 - 35 µm)*
  • 4 µm (3.5 - 4.5 µm)*
  • * typical range
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