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NCLPt

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Order Code / Price*
Quantity
NCLPt-10 Box of 10 AFM Probes
457.00 USD
NCLPt-50 Box of 50 AFM Probes
1806.00 USD
Your volume discount is 479.00 USD or 21.00%
NCLPt-W Box of 380 AFM Probes
9614.00 USD
Your volume discount is 7752.00 USD or 44.60%
Product availability: On stock

NCLPt

Electrical, Tapping Mode AFM Probe with a Long Cantilever

Manufacturer: NanoWorld

Coating: Electrically Conductive
AFM tip shape: Standard
AFM Cantilever
F 190 kHz
C 48 N/m
L 225 µm
*nominal values

NanoWorld Pointprobe® NCL AFM probes are designed for non-contact or tapping™ mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum AFM cantilever length (> 125 µm). This AFM probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally, this AFM probe offers an excellent radius of curvature.

For applications allowing higher resonance frequencies or a shorter AFM cantilever length use NanoWorld Pointprobe type NCHPt.

This AFM probe features alignment grooves on the back side of the holder chip.

PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the AFM cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 48 N/m (31 - 71 N/m)*
  • 190 kHz (160 - 210 kHz)*
  • 225 µm (220 - 230 µm)*
  • 38 µm (33 - 43 µm)*
  • 7 µm ( 6.5 - 7.5 µm)*
  • * typical range
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