AFM Probes » NCLR

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Order Code / Price*
Quantity
NCLR-10 Box of 10 AFM Probes
307.00 USD
NCLR-50 Box of 50 AFM Probes
1 215.00 USD
Your volume discount is 320.00 USD or 20.80%
NCLR-W Box of 380 AFM Probes
6 239.00 USD
Your volume discount is 5 427.00 USD or 46.50%
Product availability: On stock

NCLR

Tapping Mode AFM Probe, Long Cantilever

Coating: Reflex Aluminum
Tip shape: Standard
Cantilever:
F 190 kHz
C 48 N/m
L 225 µm
*nominal values

Applications

NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping™ mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probe offers an excellent tip radius of curvature.

For applications allowing higher resonance frequencies or a shorter cantilever length use NanoWorld Pointprobe type NCHR.

This product features alignment grooves on the back side of the holder chip.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 48 N/m (31 - 71 N/m)*
  • 190 kHz (160 - 210 kHz)*
  • 225 µm (220 - 230 µm)*
  • 38 µm (33 - 43 µm)*
  • 7 µm (6.5 - 7.5 µm)*
  • * typical range
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