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NW-DT-NCLR-10 Box of 10 AFM Probes
1220.00 USD
NW-DT-NCLR-20 Box of 20 AFM Probes
2183.00 USD
Your volume discount is 257.00 USD or 10.50%
NW-DT-NCLR-50 Box of 50 AFM Probes
4817.00 USD
Your volume discount is 1283.00 USD or 21.00%
Product availability: On stock


Diamond Coated Tapping Mode AFM Probe with Long Cantilever

Manufacturer: NanoWorld

Coating: Diamond
AFM tip shape: Standard
AFM Cantilever
F 210 kHz
C 72 N/m
L 225 µm
*nominal values
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NanoWorld Pointprobe® NCL AFM probes are designed for non-contact or tapping™ mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This AFM probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.

All AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

For applications that require hard contact between tip and sample this probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond.

The typical macroscopic tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.

For applications allowing higher resonance frequencies or a shorter AFM cantilever length use NanoWorld Pointprobe type DT-NCHR.

This AFM probe features alignment grooves on the back side of the holder chip.

Diamond Coating / Aluminum Reflex Coating

The diamond coating consists of a 100 nm thick polycrystalline diamond layer deposited on the tip side of the AFM cantilever resulting in an unsurpassed hardness of the AFM tip.

The aluminum reflex coating deposited on the detector side of the AFM cantilever enhances the reflectance of the laser beam and prevents light from interfering within the AFM cantilever.
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 72 N/m (48 - 105 N/m)*
  • 210 kHz (175 - 245 kHz)*
  • 225 µm (220 - 230 µm)*
  • 37.5 µm (32.5 - 42.5 µm)*
  • 7 µm ( 6.5 - 7.5 µm)*
  • * typical range