AFM Probes » NW-SSS-NCL

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Order Code / Price*
Quantity
NW-SSS-NCL-10 Box of 10 AFM Probes
699.00 USD
Volume Discount Available [?]
NW-SSS-NCL-20 Box of 20 AFM Probes
1 252.00 USD
Your volume discount is 146.00 USD or 10.40%
NW-SSS-NCL-50 Box of 50 AFM Probes
2 762.00 USD
Your volume discount is 733.00 USD or 21.00%
Product availability: On stock

NW-SSS-NCL

SuperSharp, Tapping Mode AFM Probe with Long Cantilever

Coating: none
Tip shape: Supersharp
Cantilever:
F 190 kHz
C 48 N/m
L 225 µm
*nominal values

Applications

NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.

This probe offers unique features:

  • excellent tip radius of curvature
  • guaranteed tip radius of curvature 5 nm (yield >80%)

This product features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 48 N/m (31 - 71 N/m)*
  • 190 kHz (160 - 210 kHz)*
  • 225 µm (220 - 230 µm)*
  • 38 µm (33 - 43 µm)*
  • 7 µm (6.5 - 7.5 µm)*
  • * typical range
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