NW-SSS-NCL

NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping^™ mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.

This probe offers unique features:

• excellent tip radius of curvature
• guaranteed tip radius of curvature 5 nm (yield >80%)

For applications allowing higher resonance frequencies or a shorter cantilever length use NanoWorld Pointprobe type SSS-NCH.

This product features alignment grooves on the back side of the holder chip.