NanoWorld Pointprobe® NCL AFM probes are designed for non-contact or tapping™ mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum AFM cantilever length (> 125 µm). This AFM probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.
For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.
This AFM probe offers unique features:
For applications allowing higher resonance frequencies or a shorter AFM cantilever length use NanoWorld Pointprobe® type SSS-NCH.
This AFM probe features alignment grooves on the back side of the holder chip.