NW-SSS-NCH

NanoWorld Pointprobe® NCH AFM probes are designed for non-contact or tapping™ mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

For enhanced resolution of nanostructures and microroughness we have developed an advanced AFM tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.

This AFM probe offers unique features:

• typical tip radius of curvature of 2 nm
• guaranteed tip radius of curvature 5 nm (yield >80%)
• half cone angle < 10° at the last 200 nm of the tip

For applications requiring lower resonance frequencies or a AFM cantilever length exceeding 125 µm use NanoWorld Pointprobe® type SSS-NCL.

This AFM probe features alignment grooves on the back side of the holder chip.