AFM Probes » NW-SSS-NCH

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Order Code / Price*
Quantity
NW-SSS-NCH-10 Box of 10 AFM Probes
743.00 USD
NW-SSS-NCH-20 Box of 20 AFM Probes
1 315.00 USD
Your volume discount is 171.00 USD or 11.50%
NW-SSS-NCH-50 Box of 50 AFM Probes
2 900.00 USD
Your volume discount is 815.00 USD or 21.90%
Product availability: On stock

NW-SSS-NCH

the industry standard

SuperSharp, Tapping Mode AFM Probe

Manufacturer: NanoWorld

Coating: none
AFM tip shape: Supersharp
AFM Cantilever
F 320 kHz
C 42 N/m
L 125 µm
*nominal values

Applications

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NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.

This probe offers unique features:

  • typical tip radius of curvature of 2 nm
  • guaranteed tip radius of curvature 5 nm (yield >80%)
  • half cone angle < 10° at the last 200 nm of the tip

For applications requiring lower resonance frequencies or a cantilever length exceeding 125 µm use NanoWorld Pointprobe type SSS-NCL.

This product features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • 42 N/m (21 - 78 N/m)*
  • 320 kHz (250 - 390 kHz)*
  • 125 µm (120 - 130 µm)*
  • 30 µm (25 - 35 µm)*
  • 4 µm ( 3.5 - 4.5 µm)*
  • * typical range
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