AFM Probes » PPP-CONTAuD

Order Code / Price*

Quantity

PPP-CONTAuD-10 Box of 10 AFM Probes

320 320.00 USD

Product availability: On stock

PPP-CONTAuD

Gold Coated Contact Mode AFM Probe

Coating: Reflex (Au)
Tip shape: Standard

Cantilever:

F 13 kHz

C 0.2 N/m

L 450 µm

*nominal values

Applications

The PointProbe^® Plus (PPP) combines the well-known features of the proven PointProbe^®series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS^™PPP-CONTAuD probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

The probe offers unique features:

excellent tip radius of curvature
highly doped silicon to dissipate static charge
Au coating on detector side of cantilever
chemically inert

This product features alignment grooves on the back side of the holder chip.

A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.