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PPP-CONTSCAuD

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PPP-CONTSCAuD-10 Box of 10 AFM Probes
381.00 USD
Product availability: On stock

PPP-CONTSCAuD

Gold Coated Contact Mode AFM Probe with Short AFM Cantilever

Manufacturer: NANOSENSORS

Coating: Reflective Gold
AFM tip shape: Standard
AFM Cantilever
F 25 kHz
C 0.2 N/m
L 225 µm
*nominal values

Applications

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The PointProbe®Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

The NANOSENSORS™ PPP-CONTSCAuD is an alternative AFM cantilever type for contact mode applications. The length of AFM cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode AFM probes for some AFM instruments. Additionally, this AFM probe type allows the application for lateral or friction force mode.

The AFM probe offers unique features:

  • excellent AFM tip radius of curvature
  • highly doped silicon to dissipate static charge
  • Au coating on detector side of AFM cantilever
  • chemically inert
  • precise alignment of the AFM cantilever position (within +/-2µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

This AFM probe features alignment grooves on the back side of the holder chip.

A metallic layer (gold) is coated on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.01 - 1.87 N/m)*
  • 25 kHz (1 - 57 kHz)*
  • 225 µm (215 - 235 µm)*
  • 48 µm (40 - 55 µm)*
  • 1 µm ( 0.1 - 2 µm)*
  • * guaranteed range
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