AFM Probes » PPP-CONTSCR

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Order Code / Price*
Quantity
PPP-CONTSCR-10 Box of 10 AFM Probes
320.00 USD
Volume Discount Available [?]
PPP-CONTSCR-20 Box of 20 AFM Probes
573.00 USD
Your volume discount is 67.00 USD or 10.50%
PPP-CONTSCR-50 Box of 50 AFM Probes
1 265.00 USD
Your volume discount is 335.00 USD or 20.90%
PPP-CONTSCR-W Box of 380 AFM Probes
6 409.00 USD
Your volume discount is 5 751.00 USD or 47.30%
Product availability: On stock

PPP-CONTSCR

Contact Mode AFM Probe with Short AFM Cantilever

Manufacturer: NANOSENSORS

Coating: Reflex Aluminum
AFM tip shape: Standard
AFM Cantilever
F 25 kHz
C 0.2 N/m
L 225 µm
*nominal values

Applications

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The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible AFM tip radius as well as a more defined AFM tip shape. The excellent AFM tip radius and the minimized variation in AFM tip shape provide more reproducible images and enhanced resolution.

The NANOSENSORS™ PPP-CONTSCR is an alternative AFM cantilever type for contact mode applications. The length of AFM cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode AFM probes for some AFM instruments. Additionally, this AFM probe type allows the application for lateral or friction force mode.

The AFM probe offers unique features:

  • excellent AFM tip radius of curvature
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of AFM cantilever
  • high mechanical Q-factor for high sensitivity
  • precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

This product features alignment grooves on the back side of the holder chip.

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. The virtually stress-free coating is bending the AFM cantilever less than 2% of the AFM cantilever length.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.01 - 1.87 N/m)*
  • 25 kHz (1 - 57 kHz)*
  • 225 µm (215 - 235 µm)*
  • 48 µm (40 - 55 µm)*
  • 1 µm ( 0.1 - 2 µm)*
  • * typical range
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