AFM Probes » PPP-FMAuD

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PPP-FMAuD-10 Box of 10 AFM Probes
320.00 USD
Product availability: On stock

PPP-FMAuD

Gold Coated Force Modulation AFM Probe

Coating: Reflex (Au)
Tip shape: Standard
Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values

Applications

The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-FMAuD is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The probe offers unique features:

  • excellent tip radius of curvature
  • highly doped silicon to dissipate static charge
  • Au coating on detector side of cantilever
  • chemically inert

This product features alignment grooves on the back side of the holder chip.

A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2.8 N/m (0.5 - 9.5 N/m)*
  • 75 kHz (45 - 115 kHz)*
  • 225 µm (215 - 235 µm)*
  • 28 µm (20 - 35 µm)*
  • 3 µm (2 - 4 µm)*
  • * typical range
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