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PPP-NCHAuD

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PPP-NCHAuD-10 Box of 10 AFM Probes
381.00 USD
Product availability: On stock

PPP-NCHAuD

Gold Coated Tapping Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: Reflective Gold
AFM tip shape: Standard
AFM Cantilever
F 330 kHz
C 42 N/m
L 125 µm
*nominal values

Applications

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The Point Probe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

NANOSENSORS™ PPP-NCHAuD AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

The AFM probe offers unique features:

  • excellent AFM tip radius of curvature
  • highly doped silicon to dissipate static charge
  • Au coating on detector side of AFM cantilever
  • chemically inert

This AFM probe features alignment grooves on the back side of the holder chip.

A metallic layer (Au) is coated on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 42 N/m (10 - 130 N/m)*
  • 330 kHz (204 - 497 kHz)*
  • 125 µm (115 - 135 µm)*
  • 30 µm (22.5 - 37.5 µm)*
  • 4 µm ( 3 - 5 µm)*
  • * guaranteed range
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