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PPP-NCSTAuD

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PPP-NCSTAuD-10 Box of 10 AFM Probes
381.00 USD
Product availability: On stock

PPP-NCSTAuD

Gold Coated Soft Tapping Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: Reflective Gold
AFM tip shape: Standard
AFM Cantilever
F 160 kHz
C 7.4 N/m
L 150 µm
*nominal values

Applications

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The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

NANOSENSORS™ PPP-NCSTAuD AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft AFM cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces AFM tip wear and sample wear at the same time.

The AFM probe offers unique features:

  • excellent AFM tip radius of curvature
  • highly doped silicon to dissipate static charge
  • Au coating on detector side of AFM cantilever
  • chemically inert

This AFM probe features alignment grooves on the back side of the holder chip.

A metallic layer (Au) is coated on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 7.4 N/m (1.2 - 29 N/m)*
  • 160 kHz (75 - 265 kHz)*
  • 150 µm (140 - 160 µm)*
  • 27 µm (19.5 - 34.5 µm)*
  • 2.8 µm ( 1.8 - 3.8 µm)*
  • * guaranteed range
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