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PPP-NCSTR

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Order Code / Price*
Quantity
PPP-NCSTR-10 Box of 10 AFM Probes
381.00 USD
PPP-NCSTR-50 Box of 50 AFM Probes
1503.00 USD
Your volume discount is 402.00 USD or 21.10%
PPP-NCSTR-W Box of 380 AFM Probes
7891.00 USD
Your volume discount is 6587.00 USD or 45.50%
Product availability: On stock

PPP-NCSTR

best of the best

Soft Tapping Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: Reflective Aluminum
AFM tip shape: Standard
AFM Cantilever
F 160 kHz
C 7.4 N/m
L 150 µm
*nominal values

Applications

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The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

NANOSENSORS™ PPP-NCSTR AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft AFM cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces AFM tip wear and sample wear at the same time.

The AFM probe offers unique features:

  • excellent AFM tip radius of curvature
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of AFM cantilever
  • chemically inert
  • high mechanical Q-factor for high sensitivity

This AFM probe features alignment grooves on the back side of the holder chip.

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 7.4 N/m (1.2 - 29 N/m)*
  • 160 kHz (75 - 265 kHz)*
  • 150 µm (140 - 160 µm)*
  • 27 µm (19.5 - 34.5 µm)*
  • 2.8 µm ( 1.8 - 3.8 µm)*
  • * guaranteed range
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