The new
Point
Probe®
Plus (PPP) combines the well-known features of the proven
PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONTR type is optimized for high sensitivity due to a low force constant.
For certain applications the rotated PointProbe® Plus Tip offers more symmetric imaging. The rotated tip shape is identical to the classic tip shape but it is rotated by 180° degrees with respect to the cantilever beam direction.
The probe offers unique features:
- excellent tip radius of curvature
- highly doped silicon to dissipate static charge
- high mechanical Q-factor for high sensitivity
