The new Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible AFM tip radius as well as a more defined AFM tip shape. The excellent AFM tip radius and the minimized variation in AFM tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONTR type is optimized for high sensitivity due to a low force constant.
For certain applications the rotated PointProbe® Plus AFM tip offers more symmetric imaging. The rotated AFM tip shape is identical to the classic AFM tip shape but it is rotated by 180° degrees with respect to the AFM cantilever beam direction.
The AFM probe offers unique features:
This product features alignment grooves on the back side of the holder chip.
