AFM Probes » PPP-RT-NCHR

 Order
 Request a quote (RFQ)
Order Code / Price*
Quantity
PPP-RT-NCHR-10 Box of 10 AFM Probes
320.00 USD
PPP-RT-NCHR-20 Box of 20 AFM Probes
573.00 USD
Your volume discount is 67.00 USD or 10.50%
PPP-RT-NCHR-50 Box of 50 AFM Probes
1 265.00 USD
Your volume discount is 335.00 USD or 20.90%
Product availability: On stock

PPP-RT-NCHR

Standard Tapping Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: Reflex Aluminum
AFM tip shape: Rotated
AFM Cantilever
F 330 kHz
C 42 N/m
L 125 µm
*nominal values

Applications

How to optimize AFM scan parameters gear icon

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible AFM tip radius as well as a more defined AFM tip shape. The excellent AFM tip radius and the minimized variation in AFM tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-RT-NCHR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

For certain applications the rotated PointProbe® Plus AFM tip offers more symmetric imaging. The rotated AFM tip shape is identical to the classic AFM tip shape but it is rotated by 180° degrees with respect to the AFM cantilever beam direction.

The AFM probe offers unique features:

  • excellent AFM tip radius of curvature
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity

This product features alignment grooves on the back side of the holder chip.

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. The virtually stress-free coating is bending the AFM cantilever less than 2% of the AFM cantilever length.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 42 N/m (10 - 130 N/m)*
  • 330 kHz (204 - 497 kHz)*
  • 125 µm (115 - 135 µm)*
  • 30 µm (22.5 - 37.5 µm)*
  • 4 µm ( 3 - 5 µm)*
  • * typical range
    Loading
    nanosensors-logo nanoworld-logo budgetsensors-logo mikromasch-logo opus-logo nanotools-logo