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PPP-XYNCHR

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Order Code / Price*
Quantity
PPP-XYNCHR-10 Box of 10 AFM Probes
381.00 USD
PPP-XYNCHR-20 Box of 20 AFM Probes
681.00 USD
Your volume discount is 81.00 USD or 10.60%
PPP-XYNCHR-50 Box of 50 AFM Probes
1503.00 USD
Your volume discount is 402.00 USD or 21.10%
Product availability: On stock

PPP-XYNCHR

Tapping Mode AFM Probe with Special Alignment System

Manufacturer: NANOSENSORS

Coating: Reflective Aluminum
AFM tip shape: Standard
AFM Cantilever
F 330 kHz
C 42 N/m
L 125 µm
*nominal values

Applications

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The XY-auto-alignment AFM probes for Non-Contact / Tapping mode application (High resonance frequency) with a Reflex coating extend the plug-and-fit alignment concept of the Alignment Chip (ALIGN) to 125µm short AFM cantilevers optimized for high speed non-contact / tapping mode applications. AFM probe exchange with an AFM tip repositioning accuracy of better than ±8µm is possible for all AFM probes of the XY-alignment AFM probes series – independent of their AFM cantilever length. This series is adjusted to the AFM tip position of AFM probes with an AFM cantilever length of 225µm.

As a matter of course, the features of the proven PointProbe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible AFM tip radius as well as a precisely defined AFM tip shape are maintained. The excellent AFM tip radius and the minimized variation in AFM tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-NCHR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

The AFM probe offers unique features:

  • excellent AFM tip radius of curvature
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of AFM cantilever
  • chemically inert
  • high mechanical Q-factor for high sensitivity
  • AFM tip repositioning accuracy of better than ±8µm (in combination with Alignment Chip)

This AFM probe features alignment grooves on the back side of the holder chip.

Aluminum reflective coating on detector side of the AFM cantilever

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 42 N/m (10 - 130 N/m)*
  • 330 kHz (204 - 497 kHz)*
  • 125 µm (115 - 135 µm)*
  • 30 µm (22.5 - 37.5 µm)*
  • 4 µm ( 3 - 5 µm)*
  • * guaranteed range
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