AFM Probes » PPP-XYNCHR

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Order Code / Price*
Quantity
PPP-XYNCHR-10 Box of 10 AFM Probes
320.00 USD
Volume Discount Available [?]
PPP-XYNCHR-20 Box of 20 AFM Probes
573.00 USD
Your volume discount is 67.00 USD or 10.50%
PPP-XYNCHR-50 Box of 50 AFM Probes
1 265.00 USD
Your volume discount is 335.00 USD or 20.90%
Product availability: On stock

PPP-XYNCHR

Tapping Mode AFM Probe with Special Alignment System

Coating: Reflex Aluminum
Tip shape: Standard
Cantilever:
F 330 kHz
C 42 N/m
L 125 µm
*nominal values

Applications

The XY-auto-alignment probes for Non-Contact / Tapping mode application (High resonance frequency) with a Reflex coating extend the plug-and-fit alignment concept of the Alignment Chip (ALIGN) to 125 µm short cantilevers optimized for high speed non-contact / tapping mode applications. Probe exchange with a tip repositioning accuracy of better than ± 8µm is possible for all probes of the XY-alignment probes series – independent of their cantilever length. This series is adjusted to the tip position of probes with a cantilever length of 225µm.

As a matter of course, the features of the proven PointProbe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible tip radius as well as a precisely defined tip shape are maintained. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-NCHR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
The probe offers unique features:
  • excellent tip radius of curvature
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of cantilever
  • chemically inert
  • high mechanical Q-factor for high sensitivity
  • tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)

This product features alignment grooves on the back side of the holder chip.

Aluminium reflex coating on detector side of the cantilever

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 42 N/m (10 - 130 N/m)*
  • 330 kHz (204 - 497 kHz)*
  • 125 µm (115 - 135 µm)*
  • 30 µm (22.5 - 37.5 µm)*
  • 4 µm (3 - 5 µm)*
  • * typical range
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