The
XY-auto-alignment probes for
Non-
Contact / Tapping mode application (
High resonance frequency) with a
Reflex coating extend the plug-and-fit alignment concept of the
Alignment Chip (ALIGN) to 125 µm short cantilevers optimized for high speed non-contact / tapping mode applications. Probe exchange with a tip repositioning accuracy of better than ± 8µm is possible for all probes of the XY-alignment probes series – independent of their cantilever length. This series is adjusted to the tip position of probes with a cantilever length of 225µm.
As a matter of course, the features of the proven
Point
Probe®
Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible tip radius as well as a precisely defined tip shape are maintained. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-NCHR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
The probe offers unique features:
- excellent tip radius of curvature
- highly doped silicon to dissipate static charge
- Al coating on detector side of cantilever
- chemically inert
- high mechanical Q-factor for high sensitivity
- tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)