The
XY-auto-alignment AFM probes for
Non-
Contact / Tapping mode application (
High resonance frequency) with a
Reflex coating extend the plug-and-fit alignment concept of the
Alignment Chip (ALIGN) to 125 µm short AFM cantilevers optimized for high speed non-contact / tapping mode applications. AFM probe exchange with an AFM tip repositioning accuracy of better than ± 8µm is possible for all AFM probes of the XY-alignment AFM probes series – independent of their AFM cantilever length. This series is adjusted to the AFM tip position of AFM probes with an AFM cantilever length of 225µm.
As a matter of course, the features of the proven PointProbe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible AFM tip radius as well as a precisely defined AFM tip shape are maintained. The excellent AFM tip radius and the minimized variation in AFM tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-NCHR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
The AFM probe offers unique features:
- excellent AFM tip radius of curvature
- highly doped silicon to dissipate static charge
- Al coating on detector side of AFM cantilever
- chemically inert
- high mechanical Q-factor for high sensitivity
- AFM tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)
