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PPP-XYNCSTR

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Order Code / Price*
Quantity
PPP-XYNCSTR-10 Box of 10 AFM Probes
381.00 USD
PPP-XYNCSTR-20 Box of 20 AFM Probes
681.00 USD
Your volume discount is 81.00 USD or 10.60%
PPP-XYNCSTR-50 Box of 50 AFM Probes
1503.00 USD
Your volume discount is 402.00 USD or 21.10%
Product availability: On stock

PPP-XYNCSTR

Soft Tapping Mode AFM Probe with Special Alignment System

Manufacturer: NANOSENSORS

Coating: Reflective Aluminum
AFM tip shape: Standard
AFM Cantilever
F 160 kHz
C 7.4 N/m
L 150 µm
*nominal values

Applications

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The XY-auto-alignment AFM probes for Non-Contact / Soft Tapping mode application with a Reflex coating extend the plug-and-fit alignment concept of the Alignment Chip (ALIGN) to 150µm short AFM cantilevers optimized for non-contact / soft tapping mode applications. AFM probe exchange with an AFM tip repositioning accuracy of better than ±8µm is possible for all AFM probes of the XY-alignment probes series – independent of their AFM cantilever length. This series is adjusted to the AFM tip position of AFM probes with an AFM cantilever length of 225µm.

As a matter of course, the features of the proven PointProbe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible AFM tip radius as well as a precisely defined AFM tip shape are maintained. The excellent AFM tip radius and the minimized variation in AFM tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-XYNCSTR AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft AFM cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces AFM tip wear and sample wear at the same time.

The AFM probe offers unique features:

  • excellent AFM tip radius of curvature
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of AFM cantilever
  • chemically inert
  • high mechanical Q-factor for high sensitivity
  • AFM tip repositioning accuracy better than ±8µm (in combination with Alignment Chip)

This AFM probe features alignment grooves on the back side of the holder chip.

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 7.4 N/m (1.2 - 29 N/m)*
  • 160 kHz (75 - 265 kHz)*
  • 150 µm (140 - 160 µm)*
  • 27 µm (19.5 - 34.5 µm)*
  • 2.8 µm ( 1.8 - 3.8 µm)*
  • * guaranteed range
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