PPP-ZEIHR

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible AFM tip radius as well as a more defined AFM tip shape. The excellent AFM tip radius and the minimized variation in AFM tip shape provide more reproducible images and enhanced resolution.

For owners of the ZEISS Veritekt microscope using the step mode (non-contact mode) we recommend NANOSENSORS™ PPP-ZEIHR AFM tips (Zeiss / high force constant). Compared with the PPP-NCH and PPP-NCL AFM probes the force constant is reduced and the resonance frequency is lower.

The AFM probe offers unique features:

• excellent AFM tip radius of curvature
• highly doped silicon to dissipate static charge
• Al coating on detector side of AFM cantilever
• high mechanical Q-factor for high sensitivity
• precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
• compatible with PointProbe® Plus XY-Alignment Series

This product features alignment grooves on the back side of the holder chip.