The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible AFM tip radius as well as a more defined AFM tip shape. The excellent AFM tip radius and the minimized variation in AFM tip shape provide more reproducible images and enhanced resolution.
For owners of the ZEISS Veritekt microscope using the step mode (non-contact mode) we recommend NANOSENSORS™ PPP-ZEIHR AFM tips (Zeiss / high force constant). Compared with the PPP-NCH and PPP-NCL AFM probes the force constant is reduced and the resonance frequency is lower.
The AFM probe offers unique features:
This product features alignment grooves on the back side of the holder chip.