AFM Probes » PPP-ZEILR

Order Code / Price*

Quantity

PPP-ZEILR-10 Box of 10 AFM Probes

320 320.00 USD

Volume Discount Available [?]

PPP-ZEILR-20 Box of 20 AFM Probes

573 573.00 USD

Your volume discount is 67.00 USD or 10.50%

PPP-ZEILR-50 Box of 50 AFM Probes

1265 1 265.00 USD

Your volume discount is 335.00 USD or 20.90%

PPP-ZEILR-W Box of 380 AFM Probes

6409 6 409.00 USD

Your volume discount is 5 751.00 USD or 47.30%

Product availability: On stock

PPP-ZEILR

Special Contact Mode AFM Probe

Coating: Reflex Aluminum
Tip shape: Standard

Cantilever:

F 27 kHz

C 1.6 N/m

L 450 µm

*nominal values

Applications

Contact Mode AFM Probes

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

For owners of a Zeiss Veritekt or Seiko Instruments microscope using contact mode we recommend NANOSENSORS™ PPP-ZEILR (Zeiss Veritekt / low force constant). Compared to the contact mode AFM probe (CONT) the force constant is slightly increased.

The probe offers unique features:

excellent tip radius of curvature
highly doped silicon to dissipate static charge
Al coating on detector side of cantilever
high mechanical Q-factor for high sensitivity

This product features alignment grooves on the back side of the holder chip.

The reflex coating is an approximately 30 nm thick aluminium coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stres-free coating is bending the cantilever less than 2% of the cantilever length.