The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible AFM tip radius as well as a more defined AFM tip shape. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide more reproducible images and enhanced resolution.
For owners of a Zeiss Veritekt or Seiko Instruments microscope using contact mode we recommend NANOSENSORS™ PPP-ZEILR (Zeiss Veritekt / low force constant). Compared to the contact mode AFM probe (CONT) the force constant is slightly increased.
The AFM probe offers unique features:
This product features alignment grooves on the back side of the holder chip.