AFM Probes » Q-WM300

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Quantity
Q-WM300-10 Box of 10 AFM Probes
270.00 USD
Product availability: Available on demand. Please contact us for availability
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Q-WM300

Premounted Standard Tapping Mode AFM Probe, for Quesant/Ambios AFM systems

Coating: Reflex Aluminum
Tip shape: Rotated
Cantilever:
F 300 kHz
C 40 N/m
L 125 µm
*nominal values

Applications

Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

Consistent high quality at a lower price!

Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors Tap300Al-G AFM probe.

Aluminium reflex coating on detector side of the cantilever, 30 nm thick

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 40 N/m (20 - 75 N/m)*
  • 300 kHz (200 - 400 kHz)*
  • 125 µm (115 - 135 µm)*
  • 30 µm (25 - 35 µm)*
  • 4 µm (3 - 5 µm)*
  • * typical range
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