SEIHR probes are designed for owners of a Seiko Instruments microscope using the non-contact mode.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
Additionally, this probe offers an excellent tip radius of curvature.