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SEIHR

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Order Code / Price*
Quantity
SEIHR-10 Box of 10 AFM Probes
335.00 USD
SEIHR-50 Box of 50 AFM Probes
1324.00 USD
Your volume discount is 351.00 USD or 21.00%
SEIHR-W Box of 380 AFM Probes
7050.00 USD
Your volume discount is 5680.00 USD or 44.60%
Product availability: On stock

SEIHR

Special Tapping Mode AFM Probe

Manufacturer: NanoWorld

Coating: Reflective Aluminum
AFM tip shape: Standard
AFM Cantilever
F 130 kHz
C 15 N/m
L 225 µm
*nominal values

Applications

How to optimize AFM scan parameters gear icon
NanoWorld Pointprobe® SEIHR AFM probes are designed for owners of a Seiko Instruments microscope using the non-contact mode.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally, this AFM probe offers an excellent tip radius of curvature.

This AFM probe features alignment grooves on the back side of the holder chip.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 15 N/m (9 - 25 N/m)*
  • 130 kHz (110 - 150 kHz)*
  • 225 µm (220 - 230 µm)*
  • 33 µm (27.5 - 37.5 µm)*
  • 5 µm ( 4.5 - 5.5 µm)*
  • * typical range
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