AFM Probes » SEIHR

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Order Code / Price*
Quantity
SEIHR-10 Box of 10 AFM Probes
307.00 USD
SEIHR-50 Box of 50 AFM Probes
1 215.00 USD
Your volume discount is 320.00 USD or 20.80%
SEIHR-W Box of 380 AFM Probes
6 239.00 USD
Your volume discount is 5 427.00 USD or 46.50%
Product availability: On stock

SEIHR

Special Tapping Mode AFM Probe

Coating: Reflex Aluminum
Tip shape: Standard
Cantilever:
F 130 kHz
C 15 N/m
L 225 µm
*nominal values

Applications

NanoWorld Pointprobe® SEIHR probes are designed for owners of a Seiko Instruments microscope using the non-contact mode.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probe offers an excellent tip radius of curvature.

This product features alignment grooves on the back side of the holder chip.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 15 N/m (9 - 25 N/m)*
  • 130 kHz (110 - 150 kHz)*
  • 5 µm (4.5 - 5.5 µm)*
  • * typical range
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