The NANOSENSORS™ SSS-MFMR AFM probe is optimized for high resolution magnetic force imaging. The SuperSharpSilicon™ AFM tip basis combined with a very thin hard magnetic coating result in an extremely small radius of the coated AFM tip and a high aspect ratio at the last few hundred nanometers of the AFM tip - the essential demands for high lateral resolution down to 20 nm in ambient conditions.
Due to the low magnetic moment of the AFM tip the sensitivity to magnetic forces is significantly decreased if compared to standard MFM probes but the disturbance of soft magnetic samples is also reduced.
The SPM probe offers unique features:
As both coatings are almost stress-free the bending of the AFM cantilever due to stress is less than 3.5% of the AFM cantilever length. For enhanced signal strength the magnetization of the AFM tip by means of a strong permanent magnet prior to the measurement is recommended.
This AFM probe features alignment grooves on the back side of the holder chip.